DYNA4 SLT—Next Generation Tester, Today
In order to produce the highest performance and quality memory modules, GeIL spares no expense in developing the most advanced IC testing technology to the production line—from EVO II, EVO III and now the DYNA SLT Fully Automatic IC Tester.
The DYNA SLT tester is able to test individual IC chip for frequency, CAS Latency, voltage and leakage, which are crucial information in determining the quality and potential of IC chips. The DYNA tester provides an anti-dust and anti-static environment and separates IC chips to designated bins. The DYNA tester offers one of the most dynamic, effective and efficient IC testing today.